- scanning transmission electron microscope (STEM)
- Смотри просвечивающий растровый электронный микроскоп (ПРЭМ).
Энциклопедический словарь по металлургии. — М.: Интермет Инжиниринг. Главный редактор Н.П. Лякишев. 2000.
scanning transmission electron microscope (STEM)
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Scanning transmission electron microscopy — A scanning transmission electron microscope (STEM) is a type of transmission electron microscope. With it, the electrons pass through the specimen, but, as in scanning electron microscopy, the electron optics focus the beam into a narrow spot… … Wikipedia
Conventional transmission electron microscope — (CTEM) is a rarely used abbreviation referring to transmission electron microscope (TEM) and high resolution transmission electron microscope (HRTEM). It is used to distinguish those parallel illumination techniques from convergent beam scanning… … Wikipedia
Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… … Wikipedia
Scanning Electron Microscope — Staubprobe von den WTC Anschlägen mit dem Rasterelektronenmikroskop aufgenommen Als Rasterelektronenmikroskop (REM) (englisch Scanning Electron Microscope, SEM) bezeichnet man ein Elektronenmikroskop, bei dem ein Elektronenstrahl in einem… … Deutsch Wikipedia
Electron microscope — Diagram of a transmission electron microscope A 197 … Wikipedia
High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… … Wikipedia
Scanning confocal electron microscopy — (SCEM) is an electron analogue of scanning confocal optical microscopy (SCOM) where electrons and electron lenses are used instead of light and optical lenses. Advantages of SCEM High energies of incident particles (200 keV electrons vs. 2 eV… … Wikipedia
Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… … Wikipedia
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
Stem — may also refer to:* a Scanning Transmission Electron Microscope (STEM) or Scanning Transmission Electron Microscopy (STEM) * STEM fields, Science, Technology, Engineering, and Mathematics, collectively considered core technological underpinnings… … Wikipedia
